Natural radiation events in CCD imagers at ground level
نویسندگان
چکیده
منابع مشابه
Technical challenges and recent progress in CCD imagers
This paper gives a review of the performance of CCD imagers for use in consumer, professional and scientific applications. An overview of recent developments and the current state-of-the-art are presented. An extensive list of references is included. © 2001 Elsevier Science. All rights reserved Keywords; CCD, imaging PACS: the PACS codes can be found at the home page of NIMA (left column, under
متن کاملSolar ultraviolet radiation on the ground level of Isfahan
Introduction: Ultraviolet (UV) radiation affects human organs such as skin, eyes and immune system, as well as animals and plants. The main natural source of UV radiation is the Sun. To study the effects of solar UV radiation there is a need to quantify variations of solar energy received on the earth surface at different intervals. Materials and Methods: To measure UV radiation a broadband fib...
متن کاملUltraviolet downconverting phosphor for use with silicon CCD imagers.
The properties and application of a UV downconverting phosphor (coronene) to silicon charge coupled devices are discussed. Measurements of the absorption spectrum have been extended to below 1000 A, and preliminary results indicate the existence of useful response to at least 584 A. The average conversion efficiency of coronene was measured to be ~20% at 2537 A. Imagery at 3650 A using a backsi...
متن کاملCan multiple shocks trigger ground level events?
A total of 16 Ground Level Events (GLE) occurred in solar cycle 23. These events, in which particle energies reach above 1 GeV/nuc, are the most energetic examples of Gradual Solar Energetic Particle (SEP) events. Over the past solar cycle, a great deal has been learned about these events observationally. However, the process by which particles are accelerated to these high energies is still pr...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microelectronics Reliability
سال: 2016
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2016.07.138